Applied Physics Chair

The Head of the Chair – Doctor of physical and mathematical science, Professor Ivan Y. Protsenko
tel: +380 (542) 39-22-72, 39-22-75
e-mail: protsenko@pph.sumdu.edu.ua

Staff

From 2002 to the Chair’s staff belong:

• Doctor of Physical and Mathematical Science, professor I.Y. Protsenko;
• Candidate of physical and mathematical science, associate professor A.M. Chornous;
• Candidate of physical and mathematical science - O.P. Kul’ment’yeva;
• Candidate of physical and mathematical science, associate professor L.V. Odnodvorets’;
• Candidate of physical and mathematical science, associate professor N.I. Shumakova;
• Candidate of physical and mathematical science, associate professor N.M. Opanasyuk;
• Candidate of physical and mathematical science, senior lecturer I.O. Shpetny;
• Candidate of physical and mathematical science, senior lecturer S.I. Protsenko;
• Candidate of physical and mathematical science working for Doctor’s degree L.V. Dechtyaruk;
• Post-graduate Y.O. Zabila;
• Post-graduate V.A. Solomacha;
• Post-graduate I.M. Pazucha;
• Post-graduate I.V. Cheshko;
• Head of the Laboratory О.S. Lobodyuk;
• Leading professional Т.P. Govorun;
• Engineer A.O. Stepanenko;
• Engineer D.V. Velykodny;
• Engineer Y.M. Gorishnyak.

Besides to the staff holding more than one office belong:

• The head of the Open Joint-Stock Company “SELMI” electronic microscopy laboratory, candidate of technical science, associate professor S.P. Zyelyev;
• The head of the Open Joint-Stock Company “SELMI” design and technical department V.P. Dubovenko;
• Senior staff scientist of Applied Physics Institute of Ukrainian National Academy of Science, candidate of physical and mathematical science S.M. Danyl’chenko.

Location

Lecture rooms, educational and scientific laboratories are located on the ground and second floors of the central and electro technical buildings, apart from that the chair has its branch office on the basis of the Open Joint-Stock Company “Selmi”.

The Main Chair’s Laboratories:

• opt electronics (training laboratory);
• thin-film technology and physics (training and scientific laboratory);
• electronic microscopic and spectral research methods (training and scientific laboratory);
• Ion-beam and plasma technologies (training and scientific laboratory);
• Nano- and microelectronics material studies (problem laboratory).

Laboratories are at full strength with all necessary equipment including three electronic microscopes, four vacuum plants ВУП-5М, super vacuum plant, mass spectrometers of МІ-1201, МХ-7104А types, plants for putting the cover using the ion and plasma method: "Plasma boiler" and "АНГА".

Regional Center of Electronic Microscopy and Mass-Spectrometry is being organized on the basis of chair equipmentї.

Educational Process

The Chair trains bachelors (4 years of study), specialists (5 years of study) and master’s degree (5 years of study) in accordance with the specialty 09.08.02- electronic instruments and devices towards the direction “Electronics”.

The specialty includes such specializations:

• Electronic Optical, Spectral and Vacuum Methods;
• Electronic and Control Devices;
• Microelectronic Sensors.

The graduates work in accordance with the obtained specialization in different spheres of industry as electronic technique engineers, engineers-researchers, electronic technique designers, scientific research and design establishments managers, teachers of physics and subjects from an “Electronics” series at secondary educational institutions, they are post-graduates in physical and mathematical specialties.

Chair General Educational Disciplines:

• Personal Computer;
• Microelectronic Sensors;
• Solar Power Engineering;
• Vacuum Technique;
• Technological Electronics’ Principles;
• Electronic and Ion Devices;
• Ultrasonic and High Frequency Devices and Technologies;
• Devices and Research Methods of Film Materials;
• Principles of Microelectronics;
• Spectral Electronic Devices;
• Charged Particles Streams Systems Forming;
• Plasma’s and Ion-Beam Technologies Principles;
• Thin-film and Coating Technologies;
• Electronic and Ionic Optics.

Scientific Research Work

The scientific school of Thin Films Physics under the supervision of honored worker of science and culture of Ukraine, Doctor of Physical and Mathematical Science, professor I.Y. Protsenko works at the Chair and besides the research towards two scientific directions is implemented.

1." Multi-layer Metallic Films Electro Physical Properties in Mutual Elements Diffusion and Phase Forming Conditions".

Scientific supervisor is a Doctor of Physical and Mathematical Science, professor Ivan Y. Protsenko.

The main executors are associate professor A.M. Chornous, associate professor L.V. Odnodvorets’, senior lecturer S.I. Protsenko, senior lecturer I.O. Shpetny, associate professor N.I. Shumakova, post-graduate Y.O. Zabila, post-graduate V.A. Solomacha.

Research methods: method of electro resistance, X-ray electronic microscopy, electronography, radiography, secondary ionic mass spectrometry and method of theoretical generalization.

Key words: thin metal films, multi-layer film structures, phase composition, diffusion processes, electro conductivity, tens sensibility, electro transmission parameters.

The following fundamental results have been received by chair’s members who work in accordance with the direction:

1. The scientific direction has been developed – the research of the dimensional and dimensional and temperature effects in the crystal structure and electro physic properties of the d-metals thin films in the conditions of inner and outer dimensional effects’ display, at that the following results have been received:
   • the inner and outer effects in refractory metals films conductivity have been studied and that gave firstly an opportunity to make a correct approbation of the effective length of the free Tillie, Tosses and Picher run and to define the row of new dimensional effects which show themselves dependently on the crystallite dimensions for such electro transmission parameters as electrons’ free run’s average length, the coefficient of electrons’ dispersion within the ambit of the crystallites;
   • using the example of Cr, Mo, Ni, Sc, Ti, Co, Cu and other thin films one has discovered the row of peculiarities of specific resistance temperature dependence within the interval of intermediate temperatures; one has confirmed the theoretical hypothesis about the intensification of the electro phonon interaction under the film’s thickness decrease;
   • one has given the beginning to the systematical research of the dimensional effects in one-layer films tens sensibility and that gave an opportunity to determine the row of new mechanisms;
   • one has made an experimental inspection of the all known theoretical models for thermal resistance coefficient and tens sensibility coefficient, determined limits of their applying and the effectiveness of the surface and grain-boundary electrons dispersion account;
   • one firstly has proposed the methods of division of the share of electro phonon, electro surface and grain-boundary dispersion for the magnitude of the specific resistance tens sensibility coefficient and resistance thermal coefficient.
2. One has made a background for the metallophysics of the multi-layer films systems on the basis of metals and metals and semi-conductors:
   • It is experimentally foreseen and proved on practice that the dependence on the thermal resistance coefficient’s thickness and on the tens sensibility coefficient has an oscillating character with an asymptotic which corresponds the magnitude of the determined coefficients for the mass patterns;
   • It is experimentally proved that on the resistance temperature dependence of the multi-layer film systems as in the case of one-layer films one observes the peculiarities under the Debye, Curie and Neel temperatures that diffuse gradually under the system’s thickness increasing;
   • The problem of exciton conductivity mechanism realization in two-layer film semi-conductor – metal systems has been analyzed; one has discovered that the reason of electro physical properties change in these systems is connected not with the excitons forming, but electronic processes’ specific character within the ambit of crystallites’ metal layer due to the coating’s atoms’ diffusion and at that this mechanism occurs even in the boundary case when a semi-conductive film has an efficient thickness in 2-3 monolayers ( thin coating);
3. One has given the beginning to the research direction towards atomic and electronic processes influence on the electro physical properties of the multi-layer film systems:
   • One has studied the processes of the elements’ mutual diffusion within the film systems and one has determined their influence on the resistance thermal coefficient and tens sensibility’ coefficient;
   • One has designed the theoretical models for the resistance coefficient and tens sensibility coefficient that take into account the dependence on the temperature or on the film’s deformation of such electricity transmission parameters as an average length of electron’s free run, the coefficients of reflectivity and passing through the crystallites boundaries of the separate layers;
   • One has determined the connections between the atomic processes of diffusion and Phases and elements division in accordance with the thin films thickness;
   • For the first time one observed a sort of isotopic effect that consists in the optionality of Cr, Ni, Cu, Fe and other isotopes interaction with the hydrogen electrons (protons);
   • It has been proved for the first time those atoms mutual diffusion coefficients in Cr, Ni, and Al coatings on page 3 increase from the magnitude 10-17 to 10-13 meters pro second after the irradiation by protons.

Defended Theses:

1. A. Chornous "Dimensional Phenomena in Electro Conductivity and Tens Sensibility of the Two-Layer Films." (1996) Scientific Supervisor - Professor I. Protsenko.
2. L. Odnodvorets’ "Kinetic Phenomena in Multi-layer Film Condensates on the Basis of Chromium, Cobalt, Nickel and Germanium." (1996). Scientific Supervisor - Professor I. Protsenko.
3. N. Opanasyuk. "Dimensional and Kinetic Phenomena in Thin Films of Chromium, Copper and Cobalt with a Low Concentration of the Crystal Structure’s Defects." (1999). Scientific Supervisor - Professor I. Protsenko .
4. Y. Ovcharenko. " Structure and Electro Physical Properties of Metal Films with a Semi-conductive Coating in Conditions of Chemical and Diffusion Atoms’ Interaction" (1999). Scientific Supervisor - Professor I. Protsenko .
5. O. Lasyuchenko "Tens sensibility Effect in Film Systems on the basis of Cu, Cr і Sc." (2001). Scientific Supervisors – Professor I.Y. Protsenko, Associate Professor V. Chvorost.
6. O. Bilous “Inner Dimensional Effect in Electro Physical Properties of Metal Films with Different Level of Dispersion." (2001) Scientific Supervisor – Associate Professor A. Chornous.
7. N. Shumakova "Structural and Phase Transformations in Metal Coatings under the influence of electrons and protons." (2000) Scientific Supervisor – Professor O. Pogrebnyak, Consultant – Associate Professor V. Chvorost.
8. I. Shpetny. "The Forming of Films Structure and Electro Physical Properties on the Basis of V, Cr, Co, Ni Phase Creation and Mutual Diffusion" (2005). Scientific Supervisor – Professor I. Protsenko.
9. S.Protsenko. "The Influence of Temperature and Deformational Dependence of Electricity Transmission Parameters on Electro Physical Properties of Multilayer Films on the Cr, Cu, Sc (Co) Basis” (2005). Scientific Supervisor – Associate Professor A. Chornous.

Selective Scientific Works:

1. S. Protsenko, A. Chornous. Methods of Share’s Division of Grain-Boundary and Surface Electrons Dispersion in the Magnitude of Specific Resistance and Temperature Coefficient of Metal Films’ Resistance // ВАНТ.- 1999.- №2(10).- P.107-109.
2. I.Protsenko, L.Odnodvorets, A. Chornous . Electro Conductivity and Tens Sensibility of Multi-layer Films // Metallophysics and the Latest Technologies.- 1998.- V.20, №1.- P.36-44.
3. I. Protsenko , S. Petrenko , L.Odnodvorets, A.Chornous . Size Effect and Processes of Interdiffusion in Multi-layer Films // Cryst. Res. Technol.- 1995.- V.30, №8.- P.1077-1081.
4. L.Odnodvorets, S.Protsenko, A.Saltykova. Electro Physical Properties of Cu, Cr Two-layer Films in Conditions of Atoms’Interdiffusion // Металлофизика и новейшие технологии. - 1999.- V.21, №8.- P.71-74.
5. Y.Ovcharenko, N.Opanasyuk, I. Protsenko, O. Shovkoplyas. Calculation of Parameters of Thin Metal Films Electro Transmission in Conditions of Inner and Outer Dimensional Effects // УФЖ.- 1997.- V.42, №7.- P.826-830.
6. O.Pogribnyak, N. Shumakova, V. Chvorost et al.. Irradiation Influence of Charged Particles’ Stream on Structural Transformations and Diffusion Processes in Protective Coatings// Visnyk SSU. - 2000, №17. - P.37-47.
7. O. Lasyuchenko , L. Odnodvoretz , I.Protsenko. Microscopic Theory of Tens sensibility of Multi-layer Polycrystalline Films // Cryst. Res. Technol. - 2000. - V.35, №3. - Р.329-332.
8. V. Tokman’, I. Protsenko, A. Chornous. The Peculiarities of the Crystal Structure and Electro Physical Properties of the Materials on the Тi, Ni, I, Co Basis// Reports’ Collection of the 12-th International Symposium “Thin Films in Electronics”.- Kharkiv: ННЦ ХФТИ, 2001.- P.23-26.
9. A.Chornous., N. Opanasyuk , A. Pogrebnjak , I. Protsenko. Experimental Test of a Tthree-Dimensional Model for Electro Physical Properties of Metal Films // Jpn. J. Appl. Phys.- 2000.- T.39, №12B.- P.L1320-L1323.
10. O. Bilous, L. Degtyaruk, A. Chornous. Dimensional and Kinetic Effects in Polycrystalline Metal Films of Cu and Ni // Metallophysics and the Latest Technologies - 2001.- V.23, №1.- P.43-50.

2."The Modification of Materials Properties by the Streams of Electrons, Ions and Plasma.”

Scientific Supervisor – candidate of physical and mathematical science, associate Professor O. Kul’ment’yeva.

Research methods: Rutherford’s inverse dispersion, auger spectrometry, radiography, method of charged particles’ beam processing and ions’ implantation.

Key words: high-energy beams of electrons, protons and ions, ionic implantation, wear resistance, electrolytic plasma.

Among the results one can mark the following new ones:

1. It is determined that the general point for the compositions on the Ti and alloyed elements ‘ basis is the raise of micro solidity and the diminution of the friction coefficient and wear as a result of putting of Ті, С, N, O; carbides, nitrides’ and amorphous phases, surface roughness diminution, raise of the dislocations’ density and the modified layer’s thickness.
2. Complex researches of crystalline structure and processes of diffusion and elements’ mixing under the action of protons enabled to discover the following structural peculiarities and observe the new phenomena:
   • It has been determined that in relatively thick coatings or in the near-surface layer a great deal of defects in the forms of vacancies and penetration atoms is formed (effective concentration 1021-1022 ^mole-1) and dislocations (concentration 1014-1015 ^mole-2);
   • Electrons’ or protons’ irradiation and double processing cause the raise of microsolidity of the coating in 1.2 -2 times;
   • It is shown that Al atoms’ mass transmission and evaporation cause the forming of the diffusion coating’s modified surface on the basis of plastic aluminates of Fe₃Al and Fe Al.

Defended Theses:

• S. Sokolov. "Modification of the Materials’ Surface Properties on the basis of Ti Compositions" (2000) Scientific Supervisor – Professor O. Pogribnyak.
• O. Bazyl’. "Ionic Implantation and Electronic Irradiation Influence on the Crystalline Structure and Ti-V-Al Alloy’s Properties " (2001) Scientific Supervisor - Professor O. Pogribnyak, Consultant – Associate Professor V. Chvorost.

Selective Scientific Works:

1. A. Pogrebnyak, Y. Tyurin, Y. Ivanov, A, Kobzev, O. Kul’ment’yeva et al.. Receiving and Research of t he Structure and Plasma and Detonation Coatings from Al2O3 // Letters to ЖТФ. -2000.- V.26, Issue21.- P.53-60.
2. A .Pogrebnjak, M. Il'jashenko , O. Kul'jment'jeva et al. Structure and Properties of Al₂O₃ and Al₂O₃+ Cr₂O₃ Coatings Deposited by Steel 3 (0,3 wt % C) Substrate Using Pulsed Detonation Technology // Vacuum. -2001.- V.62. - P.21-26.
3. A .Pogrebnyak, M. Il'jashenko , O. Kul'jment'jeva et al . The Structure and Properties of the Hard Alloy put on the Copper Mat with a Help of Impulse and Plasma Technology. // Technical Physics Magazine. -2001.- V.71, Issue 7.- P.11-118.
4. A. Pogrebnyak, N. Shumakova. Change of the Structure and Properties of the Nickel and Chromium Coatings after Electronic Irradiation // Visnyk SSU.- 1997.- №1.- P.109-111.
5. A ,Pogrebnjak, N. Shumakova. Effect of "Duplex" Treatment of Changes of Physical and Mechanical Properties of Steel (0,3 wt% C) // Surf. Coatings Technol.- 1999.- V.122.- P.183-187.
6. A. Pogrebnyak, E. Bazy;, S. Sokolov et al. The Research of the Long-range Effect under the High Dose Ionic Implantation into Metals // Metallophys. The Latest Technologies.- 1999.- V.21, №8.- P.61-70.
7. E. Bazyl, A. Pogrebnyak, N. Svyrydenko. Carbides’ Forming Processes in Molybdenum and Titan.

Materials for the Discipline “ Personal Computer”( 1 year )

Pentium (~ 25 Kb)
Celeron D (~ 1 Mb)
LGA 775 (~ 1,7 Mb)
Prescott (~ 0,5 Mb)